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Our Services Demand Service We have experience in the full range of FEI instruments: FIB 610/611, FIB 200, FIB 800, DB 820, DB 825i, XL50, XL 830/865, DB 835/865. Expert troubleshooting and component ...
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About Us Electron/Ion microscope service is a balance of customer needs, time, and cost. Often the service provider can only accommodate one combination of the three and the instrument owner prioritiz...
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Supported Microscopes SEM FIB Dual Beam Tel. (888) 458-4035 | Fax. (503) 828-0460 | 6795 NE Evergreen Pkwy Suite 202, Hillsboro, OR 97124 © Copyright 2023 • All Rights Reserved
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Secondary Electron Detector, CDEM STS-30-1013
Secondary Electron Detector, CDEM STS-30-1013 Direct replacement for secondary electron detector for FEI: FIB200, FIB800, DB820, XL830/860, DB835/865. Rep...